SN74BCT8373ANT
Texas Instruments
Product No:
SN74BCT8373ANT
Manufacturer:
Package:
24-PDIP
Batch:
-
Datasheet:
Description:
IC SCAN TEST DEVICE LATCH 24-DIP
Quantity:
Delivery:
Payment:
In Stock : Please Inquiry
Please send RFQ , we will respond immediately.
Product Information
Parameter Info
User Guide
| Operating Temperature | 0°C ~ 70°C |
| Series | 74BCT |
| Package / Case | 24-DIP (0.300", 7.62mm) |
| Logic Type | Scan Test Device with D-Type Latches |
| Mfr | Texas Instruments |
| Supply Voltage | 4.5V ~ 5.5V |
| Number of Bits | 8 |
| Package | Tube |
| Mounting Type | Through Hole |
| Product Status | Obsolete |
| Supplier Device Package | 24-PDIP |
| Base Product Number | 74BCT8373 |
Recommended Parts
SN74BCT8373ANT Related Blog
Purchase must see! Electronic component selection from entry to give up
2024-10-24 28
Basic knowledge of crystal vibration, circuit design, non-vibration reasons, circuit principle, crystal frequency, digital circuit application (crystal vibration data download)
2024-04-08 88
Order transfer! A 30-year old Hong Kong-owned PCB factory in Shenzhen was sold
2024-02-22 34
New product release | Daoheshun infrared methane sensor, guarding the "last pass" of gas safety
2024-02-22 21
2000+Daily average RFQ Volume
30,000,000Standard Product Unit
2800+Worldwide Manufacturers
15,000 ㎡In-stock Warehouse
Quick Links
CopyRight © 道合顺 2013 - 2022 粤ICP备18104022号 粤公网安备 44030402004525号