24-PDIP
IC SCAN TEST DEVICE BUFF 24-DIP
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Quantity:
MAX198BCNI
Analog Devices Inc./Maxim Integrated
2225Y0500124KDR
Knowles Syfer
PNP5WVJR-73-82R
YAGEO
807-088-420-204
EDAC Inc.
RC0402F105CS
Samsung Electro-Mechanics
